Dielectric Properties and Applications of CVD Diam

Authors: B M Garin V V Parshin V I Polyakov A I Rukovishnikov E A Serov O S Mocheneva Ch Ch Jia W Z Tang F X Lu

Publish Date: 2013

Volume: , Issue: , Pages: 79-87

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Abstract

The results of investigation of the dielectric properties in the millimeter and terahertz ranges of diamond samples prepared by using the direct current arc plasma jet APJ and the microwave plasma chemical vapour deposition MPCVD techniques are presented Various methods for the measurements of the dielectric properties using highQ open resonators and cylindrical cavity resonators are discussed while the activation energy of the conductivity and point defect parameters such as concentration and activation energy of the defect induced levels in both kinds of diamonds are studied via Conductivity and Chargebased Deep Level Transient Spectroscopy QDLTS measurements for the first time in APJ diamond and compared The absorption mechanisms in these diamonds grown by different methods are discussed

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