Journal Title
Title of Journal: Electron Mater Lett
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Abbravation: Electronic Materials Letters
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Publisher
The Korean Institute of Metals and Materials
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Authors: Devaraj Soundararajan Youngjoo Lim MyongPyo Chun Ki Hyeon Kim
Publish Date: 2013/03/15
Volume: 9, Issue: 2, Pages: 177-182
Abstract
Nanostructured ZnTe thin films on glass substrate were obtained by using a thermal evaporator Structure topography composition and optical transmittance of the film were analyzed using xray diffractometer Scanning probe microscope xray photoelectron spectroscopy and UVVisspectrophotometer respectively Dielectric studies such as dielectric constant and loss tangent tan δ as a function of frequency for ZnTe film with Al/ZnTe/Al MSM configuration reveals dielectric constant of the ZnTe as 79 Electrical characterization of the prepared MSM structure was analyzed by measuring currentvoltage The conduction mechanism was deduced as Schottky type from the I–V study
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