Authors: K Rajasekar L Kungumadevi A Subbarayan R Sathyamoorthy
Publish Date: 2007/09/06
Volume: 14, Issue: 1, Pages: 69-72
Abstract
Thin films of Sb2Te3 and Sb2Te370Bi2Te330 alloy and have been deposited on precleaned glass substrate by thermal evaporation technique in a vacuum of 2 × 10−6 Torr The structural study was carried out by Xray diffractometer which shows that the films are polycrystalline in nature The grain size microstrain and dislocation density were determined The Seebeck coefficient was determined as the ratio of the potential difference across the films to the temperature difference The power factor for the Sb2Te370 Bi2Te330 and Sb2Te3 is found to be 19602 and 1066 of the film of thickness 1500 Å respectively The Van derPauw technique was used to measure the Hall coefficient at room temperature The carrier concentration was calculated and the results were discussed
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