Authors: D Contarato J M Bussat P Denes L Greiner T Kim T Stezelberger H Wieman M Battaglia B Hooberman L Tompkins
Publish Date: 2008/01/16
Volume: 69, Issue: 6, Pages: 963-967
Abstract
This paper summarizes the recent progress in the design and characterization of CMOS pixel sensors at LBNL Results of lab tests beam tests and radiation hardness tests carried out at LBNL on a test structure with pixels of various sizes are reported The first results of the characterization of backthinned CMOS pixel sensors are also reported and future plans and activities are discussed
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