Authors: D Becerra V Agarwal
Publish Date: 2008/01/19
Volume: 16, Issue: 2, Pages: 191-195
Abstract
The influence of low temperature of the electrolyte on the surface and interface of porous silicon and its application in optical devices has been studied Porous Si–bulk Si interface profile was observed by means of the high resolution SEM images At low temperatures a decrease in the interface roughness and an increase in the pore size has been observed These results were used to fabricate optical filters for UV and visible regions at low temperatures As compared to the filters fabricated at room temperature an increased optical response is reported for the filters formed at low temperature
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