Authors: N I Mashin E A Chernyaeva A N Tumanova L M Gafarova
Publish Date: 2016/03/18
Volume: 83, Issue: 1, Pages: 56-60
Abstract
A new XRF procedure for the determination of the mass absorption coefficient in thin film Ti/V and V/Ti twolayer systems has been proposed The procedure uses easytomake thinfilm layers of sputtered titanium and vanadium on a polymer film substrate Correction coefficients have been calculated that take into account attenuation of primary radiation of the Xray tube as well as attenuation of the spectral line of the bottom layer element in the top layer
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