Authors: YuWei Qin Hong Zhao ZhongQin Zhuang Lu Zhang
Publish Date: 2011/11/22
Volume: 43, Issue: 6-10, Pages: 83-90
Abstract
A high resolution spectraldomain optical coherence tomography SDOCT system based on a thermal light source was presented A novel normalized method was introduced to remove the background noise and the DC noise of the interference spectrum A Gaussian spectral calibration procedure was performed to improve axial resolution and image quality before reconstructing OCT image With the proposed method the quality of the obtained images was greatly improved Twodimensional 2D crosssectional images with axial resolution of 12 μm were obtained Furthermore the film thickness of singlelayer film sample was obtained The experimental result demonstrates the SDOCT system has potential for film thickness measurement and surface topography
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