Authors: Zachary Nuño Brandon Hessler Bryan Heiberg Ralph Damato Terry Dunlap YoungSeok Shon Yohannes Abate
Publish Date: 2012/02/14
Volume: 14, Issue: 3, Pages: 766-
Abstract
Spectroscopic nearfield imaging of single silicashell/Aucore and pure silica nanoparticles deposited on a silicon substrate is performed in the infrared wavelength range λ = 9–11 μm using scatteringtype scanning nearfield optical microscopy sSNOM By tuning the wavelength of the incident light we have acquired information on the spectral phonon–polariton resonant nearfield interactions of the silicashell/Aucore and pure silica nanoparticles with the probing tip We made use of the enhanced nearfield coupling between the high index Aucore and the probing tip to achieve spectral nearfield contrast of the thin silica coating thickness 10 nm Our results show that spectroscopic imaging of thin coating layers and complex core–shell nanoparticles can be directly performed by sSNOMThe financial support provided by the Department of Physics and Astronomy and the College of Natural Science and Mathematics CNSM California State University Long Beach startup grant the American Chemical Society Petroleum Research Fund ACS PRF under grant PRF 50461UNI10 and from Research Corporation for Science Advancement Award are all gratefully acknowledged
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