Authors: G J Wang Y C Lin G S Lin
Publish Date: 2007/01/26
Volume: 13, Issue: 11-12, Pages: 1471-1475
Abstract
In this research dependency of the contact resistance on the hardness of the gold bump and process parameters such as the contact area and the load pressure of the extra fine pitch chiponglass COG flat panel display FPD packaging is investigated The FJ2530 anisotropic conductive film ACF by Sony Inc containing the currently smallest 3 μm conductive particles is implemented to conduct the experiments Feasibility of the 3 μm ACF in ultrafine pitch COG applications is further examined From the experimental results we found that no special process is required to obtain a satisfied contact resistance for the ultra fine pitch packaging based on the 3 μm conductive particles It can be concluded that the combination of the 3 μm conductive particles and the IC gold bumps with hardness 70 Hv can lead to a miniaturized device with less cost For mass production test sample with pitch space being larger than 10 μm is suggested to retain a better reliability
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