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Title of Journal: J Mater Sci Mater Electron

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Abbravation: Journal of Materials Science: Materials in Electronics

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Springer US

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DOI

10.1007/s10916-005-6103-7

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ISSN

1573-482X

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Growth and characterization of wellaligned rutile

Authors: C A Chen A Korotcov YingSheng Huang W H Chung D S Tsai K K Tiong
Publish Date: 2008/02/12
Volume: 20, Issue: 1, Pages: 332-335
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Abstract

Wellaligned TiO2 nanocrystals NCs were prepared by metalorganic chemical vapour deposition on sapphire SA 100 and 012 substrates using TiOCHCH324 as precursor The surface morphology structural and spectroscopic properties of the deposited NCs were characterized using field emission scanning electron microscopy FESEM Xray diffractometry XRD and Raman spectroscopy RS FESEM micrographs show that the NCs on SA100 are vertically aligned XRD determines the preferable orientations of the asdeposited NCs RS confirms rutile phase of the NCs The roles of substrate orientations for the formation of different textures of TiO2 NCs are discussed

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