Authors: Gao Min
Publish Date: 2010/03/19
Volume: 39, Issue: 9, Pages: 1782-1785
Abstract
All current techniques for ZT measurement are carried out under a small temperature difference despite the fact that thermoelectric devices are likely to operate under a relatively large temperature difference In this paper we describe a new technique which enables ZT measurement under a large temperature difference The principle of measurement is presented followed by a proofofconcept study The results of this study show that ZT values obtained under a large temperature difference differ significantly from those obtained under small temperature differences The technique provides a more realistic evaluation of thermoelectric materials and devices
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