Authors: W Telieps
Publish Date: 1987/09/01
Volume: 44, Issue: 1, Pages: 55-61
Abstract
In lowenergy electron microscopy LEEM surfaces are imaged with LEED electrons The physical and electronoptical principles of the method are described as well as a prototype LEEM microscope Micrographs of Mo Si and Au surfaces illustrate the various types of contrast obtained with LEEM and its application
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