Authors: Min Hu David Fattal Jingjing Li Xuema Li Zhiyong Li R Stanley Williams
Publish Date: 2011/09/29
Volume: 105, Issue: 2, Pages: 261-266
Abstract
We fabricated and measured the farfield optical properties of a subwavelength Si3N4 silicon nitride two dimensional grating Frequencydependent transmission measurements from a whitelight source revealed that both transverse magnetic TM and transverse electric TE modes were excited on the grating We determined the dispersion relations of the modes by tilting the sample with respect to the incoming light beam and measuring the frequency shift of the absorption features By comparing to a simple model we determined the effective refractive index for the TM and TE modes and the geometrical constants for the grating This information enables gratings with desired optical properties to be designed and fabricated The application of the subwavelength grating for surfaceenhanced Raman scattering SERS is demonstrated
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