Authors: B Yang YP Wang F Wang YF Chen SN Zhu ZG Liu WW Cao
Publish Date: 2005/06/01
Volume: 81, Issue: 1, Pages: 183-186
Abstract
Highly textured perovskite Bi3TiNbO9 BTN thin films have been fabricated on fused silica substrates using pulsed laser deposition PLD Film surface and structural properties were measured by using atomic force microscopy AFM and Xray diffraction The optical properties such as the wavelength dependence of the transmittance and the refractive index were determined A band gap of Eg=355 eV was obtained experimentally Optical properties were characterized by using a prismcoupling technique We observed sharp and distinguishable transverse electric TE and transverse magnetic TM multimodes and measured the refractive indices of BTN thin films at 6328 nm The ordinary and extraordinary refractive indices were calculated to be no=23528 and ne=23942 This means a birefringence of Δn=neno=00414 for BTN films These results show the potential of using BTN films as an electrooptical active material
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