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Title of Journal: Appl Phys A

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Abbravation: Applied Physics A

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Springer-Verlag

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DOI

10.1007/bf01723154

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1432-0630

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Dynamic lowtemperature scanning force microscopy

Authors: W Allers S Langkat R Wiesendanger
Publish Date: 2014/03/19
Volume: 72, Issue: 1, Pages: S27-S30
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Abstract

We present atomically resolved images of nickel oxide 001 obtained with low temperature noncontact atomic force microscopy Using iron coated silicon cantilevers it is possible to distinguish defects with a vertical resolution of less than 10 pm and to obtain atomic resolution across step edges on the upper and lower terrace within 1 nm of the edge The noise level in these images could be reduced to ≈15 pm

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