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Title of Journal: Appl Phys A

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Abbravation: Applied Physics A

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Springer-Verlag

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DOI

10.1007/s00592-015-0736-x

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1432-0630

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Photoelectron spectroscopy of Ar/Cu100 interface

Authors: M Rohleder W Berthold J Güdde U Höfer
Publish Date: 2007/06/09
Volume: 88, Issue: 3, Pages: 527-534
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Abstract

Buried interface states in Ar/Cu100 were studied by means of one and twophoton photoemission experiments With increasing Ar overlayer thickness a transition from broad electron scattering resonances in the Ar conduction band into a hydrogenlike series of quasibound states at the Ar/Cu interface was observed The thickness dependence of energies and lifetimes is compared to theoretical resonance positions and linewidths derived from a parameterized onedimensional potential

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