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Title of Journal: Appl Phys A

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Abbravation: Applied Physics A

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Springer-Verlag

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10.1007/s00340-014-5930-y

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1432-0630

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Dielectric investigations in SrSubscript075/Su

Authors: I A Santos R G Mendes J A Eiras J de Los S Guerra E B Araújo
Publish Date: 2009/01/08
Volume: 95, Issue: 3, Pages: 757-760
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Abstract

The dielectric properties of Sr075Ba025Nb2O6 relaxor ferroelectric thin films were carefully analyzed In contrast to bulk samples which present three distinct dielectric relaxation phenomena Sr075Ba025Nb2O6 thin films present only two of them The suppression of the third anomaly can be mainly attributed to the narrow grain size distribution of nanograins and weak tensile strains imposed to the film from the substrate The whole set of results point to the interpretation of a dielectric response characteristic of mesoscopic structure which is composed of clusters and nanodomains

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