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Title of Journal: Appl Phys A

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Abbravation: Applied Physics A

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Springer Berlin Heidelberg

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DOI

10.1016/0042-207x(60)90471-1

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1432-0630

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Infrared optical properties of PbZrSubscript04

Authors: GS Wang ZG Hu ZM Huang J Yu FW Shi T Lin JH Ma Q Zhao JL Sun XJ Meng SL Guo JH Chu
Publish Date: 2004/01/01
Volume: 78, Issue: 1, Pages: 119-123
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Abstract

PbZr04Ti06O3/La05Sr05CoO3 heterostructures have been grown on Pt/Ti/SiO2/Si substrates by chemical solution routes Optical properties of the PbZr04Ti06O3/La05Sr05CoO3 heterostructures were studied by infrared spectroscopic ellipsometry IRSE in the spectral range of 25–125 μm The optical constants of PbZr04Ti06O3 and La05Sr05CoO3 thin films were determined by fitting the IRSE data using a classical dielectric model and a Drude dielectric model respectively For PbZr04Ti06O3 thin films the refractive index decreases and the extinction coefficient increases as the wavelength increases For La05Sr05CoO3 thin films the refractive index and the extinction coefficient increase as the wavelength increases The absorption coefficient of La05Sr05CoO3 thin films is greater than 104 cm1 for the wavelength range of 25–125 μm The absorption coefficient of PbZr04Ti06O3 thin films on a La05Sr05CoO3/Pt/Ti/SiO2/Si substrate is smaller than that on a Pt/Ti/SiO2/Si substrate by a factor of two

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