Authors: Manfred Schreiner Michael Melcher Katharina Uhlir
Publish Date: 2006/10/10
Volume: 387, Issue: 3, Pages: 737-747
Abstract
Scanning electron microscopy has been extensively used for the material characterization of objects of artistic and archaeological importance especially in combination with energy dispersive Xray microanalysis SEM/EDX The advantages and limitations of SEM/EDX are presented in a few case studies analysis of pigments in crosssections of paint layers quantitative analysis of archaeological glass from the Roman period excavated in Ephesos/Turkey and investigations on glasses with medieval composition concerning their weathering stability and degradation phenomenaThe authors want to express their sincere thanks to the following people for their cooperation intense discussions of the objectives and the results obtained by analysis Dr B Czurda Österreichisches Archäologisches Institut Austrian Archaeological Institute Vienna/Austria Dr R Linke Bundesdenkmalamt Federal Office for the Preservation of Austrian Cultural Heritage Vienna/Austria and Dr K Kreislova SVUOM Ltd Prague/Czech RepublicProf Dr G Friedbacher Institute for Chemical Technologies and Analytics Vienna University of Technology and Prof Dr J Wernisch Institute of Solid State Physics Vienna University of Technology Vienna/Austria are greatfully acknowledged for enabling the SEM/EDX measurements at the Jeol 6400 combined with Philips EDAX Phoenix and Philips ESEM XL30 respectively
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