Authors: Markus Himmelsbach Mario Waser Christian W Klampfl
Publish Date: 2014/02/06
Volume: 406, Issue: 15, Pages: 3647-3656
Abstract
A straightforward procedure for direct mass spectrometric MS analysis of spots from thin layer chromatography TLC plates without the need of an external ion source was developed using the aluminum plate backing as spray tip The spots were cut out shaped as a tip with a 60° angle mounted in front of the MS orifice and after addition of a spray solvent spectra were obtained immediately A highresolution timeofflight MS was used since the method is of particular interest for rapid identification or confirmation of spots from TLC plates The practical benefits of this technique were demonstrated by detection of byproducts of organic reactions by identification of degradation products and by accurate confirmation of spots when UV filters in sunscreens were analyzed by TLC Employing the described method TLC spots can be evaluated fast without the need of an external ion source or devices for analyte transfer from TLC to MS only a basic MS instrument and a highvoltage power supply is required
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