Authors: Manish Chauhan Farghalli A Mohamed
Publish Date: 2007/01/04
Volume: 42, Issue: 5, Pages: 1606-1614
Abstract
Experiments were conducted on electrodeposited ED nanocrystalline nc Ni with an average initial grain size of about 20 nm at 393 K to study the shape of the creep curves In addition microstructure was examined by means of transmission electron microscopy TEM The results show that the creep curves are characterized by the presence of a welldefined steadystate stage An examination of the microstructure indicates that while grain growth occurs during deformation the grain size attains a constant value once steady state creep is approached A comparison between grain size measurements obtained by the TEM technique and those obtained via the Xray diffraction method shows that the use of the latter method may lead to an underestimation of the value of the average grain size
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